"False negative - that one is going to kill you" - Understanding Industry Perspectives of Static Analysis based Security Testing

Amit Seal Ami, Kevin Moran, Denys Poshyvanyk, Adwait Nadkarni

To be published at the 2024 IEEE Symposium on Security and Privacy (S&P)!

This repository contains the following artifacts of this study:

• Survey Questionnaire, with informed consent form [pdf]
• Interview Consent Form [pdf]
• Interview Guide [pdf]

Preprint

https://amitsealami.com/false-negatives-kill/

Bibliography

@inproceedings{ami-fn-oakland24,
  author = {Ami, Amit Seal and Moran, Kevin and Poshyvanyk, Denys and Nadkarni, Adwait},
  title = {{"False negative - that one is going to kill you" - Understanding Industry Perspectives of Static Analysis based Security Testing}},
  booktitle = {Proceedings of the 2024 IEEE Symposium on Security and Privacy (S\&P)},
  address = {San Francisco, CA, USA},
  year = {2024},
  publisher = {IEEE Computer Society},
  month = may,
  pdf = {https://amitsealami.com/publications/ami-fn-oakland24.pdf},
  month_numeric = {5}
}