klarfkit can be used to analyze semiconductor wafer maps to locate issues with production or failing parts:
Simply load a klarf file, typically with the extension .001
into the WaferMap and generate plots from that klarf
- Generate a plot to locate defects caused by process variation
- Overlay several KLARF defect files into one wafer map to find hidden process issues
- Color defects on the defect map by time, process, defect class, size, inspector, or any number of KLARF attributes
- Edit KLARF files by exporting the raw data to CSV or Excel formats and importing the data back into KLARF format
- Combine several KLARF files together
pip install git+https://github.com/MichaelHotaling/klarfkit.git
If you have different file versions, please consider adding them to the sample_files
folder via Pull Request.
Any additional files are very welcome and help to ensure the library works for all KLARF versions.
Please create an issue in the klarfkit repository.