{"payload":{"header_redesign_enabled":false,"results":[{"id":"694578800","archived":false,"color":"#DA5B0B","followers":13,"has_funding_file":false,"hl_name":"PanithanS/Defect-Prediction-in-Semiconductor-Lithography","hl_trunc_description":"Lithography defect prediction for microchip manufacturing optimization with machine learning model","language":"Jupyter Notebook","mirror":false,"owned_by_organization":false,"public":true,"repo":{"repository":{"id":694578800,"name":"Defect-Prediction-in-Semiconductor-Lithography","owner_id":83627892,"owner_login":"PanithanS","updated_at":"2023-12-02T18:14:38.764Z","has_issues":true}},"sponsorable":false,"topics":["machine-learning","data-analysis","lithography","semiconductor-manufacturing","defect-detection","yeild","yeild-opimization"],"type":"Public","help_wanted_issues_count":0,"good_first_issue_issues_count":0,"starred_by_current_user":false}],"type":"repositories","page":1,"page_count":1,"elapsed_millis":85,"errors":[],"result_count":1,"facets":[],"protected_org_logins":[],"topics":null,"query_id":"","logged_in":false,"sign_up_path":"/signup?source=code_search_results","sign_in_path":"/login?return_to=https%3A%2F%2Fgithub.com%2Fsearch%3Fq%3Drepo%253APanithanS%252FDefect-Prediction-in-Semiconductor-Lithography%2B%2Blanguage%253A%2522Jupyter%2BNotebook%2522","metadata":null,"warn_limited_results":false,"csrf_tokens":{"/PanithanS/Defect-Prediction-in-Semiconductor-Lithography/star":{"post":"FVxjA9qKTyh1bucTeDIZ9-R4iYz1g0SGbuHcsWQ9hF64-vlNnXkJoMDpGEcyRgaiGZopp8fO62jG_wN1KfwEpg"},"/PanithanS/Defect-Prediction-in-Semiconductor-Lithography/unstar":{"post":"JAO7ghhXW1WlVkUb53nZ5U2RPLM3tlmxVWBWxss5OxFbpmSkCHRHlGrMPgwdrAAI-ISo_ugytk5ExSoHZdXBew"},"/sponsors/batch_deferred_sponsor_buttons":{"post":"F-Y-Yt-4xUz8eyPxabkOJcT74-nutPxnPiObYauFEFZ35BUbG5iHksb1Jai6cFX_gAqC77wMQRAQWH2TZfti1Q"}}},"title":"Repository search results"}